Tessent Streaming Scan Network (SSN): No-compromise DFT - Geir Eide, Director, Tessent, Siemens EDA

The increasing complexity in large System on Chip (SoC) designs present challenges to design-for-test (DFT). Hierarchical DFT is no longer enough. Tessent Streaming Scan Network (SSN) technology eliminates the difficult and costly trade-offs between DFT implementation effort and manufacturing test cost by decoupling core-level and chip-level DFT. With SSN, a true no-compromise approach to DFT is possible.